The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 26, 1990
Filed:
Apr. 07, 1989
Yasuo Ikeda, Tokyo, JP;
Kiyotaka Sakai, Tokyo, JP;
Ichiro Itagaki, Kamakura, JP;
Masato Mikami, Kamakura, JP;
Shoji Nagaoka, Kamakura, JP;
Toray Industries, Inc., Tokyo, JP;
Abstract
An apparatus for determining the functioning properties of cells which includes a sample containing chamber, a rotor disposed in the chamber and having a conical surface which faces the inner bottom surface of the chamber at an angle of not greater than 2.degree., a ray transmission path from which a ray is projected into a sample of a cell suspension between the rotor and the inner bottom surface, and a transmitted ray detection path from which transmittance from the sample is detected. The optical path length in the sample is not smaller than 1 cm. An adequate shear stress is applied to the sample by adjusting the gap between the rotor and the inner bottom surface and rotating the rotor. A fine response by the cells caused by the applied shear stress, particularly the aggregation of platelets in a platelet suspension, can be accurately and quantitatively determined with a high sensitivity.