The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 26, 1990
Filed:
Jan. 25, 1989
John D Lymer, Toronto, Ontario, CA;
Neil D Glossop, Willowdale, Ontario, CA;
W Dayle Hogg, Orlenas, Ontario, CA;
Raymond M Measures, Thornhill, Ontario, CA;
Roderick C Tennyson, Thornhill, Ontario, CA;
Other;
Abstract
A damage detection and evaluation system utilizes optical fibers to detect and assess damage to a structure. The optical fibers are intermittently etched in a controlled manner to weaken them so they fracture when a desired load is applied to the structure. Where visual inspection of the optical fibers is used to check for damage, a reference set of optical fibers is used. Where photodetection is used and minimal connections to the structure are required, one end of the optical fiber is made reflecting so an optical connection is only made to the other end. To further simplify the connection, a single input/output optical connection to a demultiplexing/multiplexing chip mounted on or within the structure is provided. Where orthogonal grids of fibers are not possible, the invention provides interdigitated optical fibers and volume backscattering to locate the position of the first fracture along the length of the optical fiber. The entire periphery of a damaged area can then be determined with a set of such interdigitated optical fibers. Again, a single optical interface to the structure can be provided using a demultiplexing/multiplexing chip. In the case of composite materials, the optical fibers are located between specified plys and at a specified orientation for optimum sensitivity.