The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 26, 1990
Filed:
Jun. 09, 1989
Leo Beiser, Flushing, NY (US);
Leo Beiser Inc., Flushing, NY (US);
Abstract
A light scanning system is disclosed which reduces the effects of wobble without the need for complex, cumbersome, or expensive optical equipment. A light source is provided for generating an input light beam. A reflector subsystem receives the input light beam, the subsystem including first and second light-reflective plane surfaces, the planes of which intersect at an obtuse angle. The first light-reflective surface is oriented to receive the input light beam and reflect it toward the second light-reflective surface, and the second light-reflective surface is oriented to further reflect the light beam to be approximately orthogonal the direction of the input light beam. Means are provided for rotating the reflector subsystem on an axis which substantially corresponds to the direction of the input light beam. In a preferred embodiment, the planes of said first and second light-reflective surfaces intersect to include an angle of about 135.degree.. In this embodiment, the axis of rotation of the reflector subsystem forms an angle of about 22.5.degree. with respect to said first light-reflective surface. In a form of the invention, means are provided for focusing said reflector subsystem output beam. The focusing means includes a lens which is operative to focus substantially parallel displaced beams to a single scan line upon rotation of the reflector subsystem.