The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 19, 1990
Filed:
Jul. 28, 1989
Applicant:
Inventors:
Assignee:
Mitsubishi Denki Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N / ;
U.S. Cl.
CPC ...
358106 ; 369 58 ;
Abstract
The apparatus inspects defects on tracks of an object to be inspected such as an optical disc or stamper. The apparatus has a defect detector, a controller for controlling the movement of the object, and a microscope for observing the tracks of the object. Position information on defects is obtained by the detector and, according to this position information, the object is moved so that the defects can be in the visual field of the microscope.