The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 19, 1990
Filed:
Nov. 17, 1988
Fritz Bierleutgeb, Vienna, AT;
Reichert Jung Optische Werks, A.G., Vienna, AT;
Abstract
A microscope with continuously or discontinuously variable objective magnification is provided with an autofocus system whose beam path passes through the objective and is directed out of the imaging beam path of the microscope between objective and eye piece to at least one photo-electric detector means. At least one optical system is located or locatable in the beam path of the autofocus system which allows or causes the at least one image formed on the detector means to be altered in scale when a change in the objective magnification occurs. The at least one optical system can be a zoom system or a series of lenses or fixed lens systems arranged to be inserted into the beam path of the focusing system. When the objective or objective magnification is changed, a coupling mechanism serves to appropriately vary the focal length of the at least one optical system located or locatable in the beam path of the autofocus system. Furthermore, a pattern comprising a light/dark contrast is projected into the object plane. This ensures in incident light operations that the system is optimally focused even with low contrast objects.