The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 19, 1990

Filed:

Oct. 21, 1988
Applicant:
Inventor:

Ulrich Heim, Reinfield, DE;

Assignee:

Dragerwerk AG, Lubeck, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
422 58 ; 422 87 ; 436165 ;
Abstract

A process for the measuring of flat discoloration zones of an indicator substrate, which is transported into a measuring position and treated with a gaseous test medium there, is improved with regard to the measuring dynamic and the construction of the apparatus by producing a flow of the test medium along the surface of the section of an indicator substrate held in a measuring position, by providing several optical control zones staggered in the longitudinal direction of the test flow and by connecting it with an electronic evaluation instrument for the production of the measurement in such a way that the actual measure value is formed from the measuring of the discoloration of the indicator substrate along the control zones.


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