The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 19, 1990
Filed:
Jul. 05, 1988
Applicant:
Inventors:
Anthony M Tai, Northville, MI (US);
John N Cederquist, Ann Arbor, MI (US);
Assignee:
Environmental Research Institute of Michigan, Ann Arbor, MI (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356354 ;
Abstract
In a speckle imaging process, the contribution of non-uniform, incoherent background illumination is removed via an aperture sampling technique. A pair of uncorrelated speckle images are produced and subtracted from one another to eliminate the non-coherent background contribution. The result of this subtraction is rectified so as to provide a signal which may be displayed on a video display. Disclosed are techniques for real time video display of enhanced speckle images as well as techniques for visualizing vibrational modes and surface roughness mapping.