The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 12, 1990
Filed:
Nov. 15, 1988
Applicant:
Inventors:
Donald E Vandenberg, Brockport, NY (US);
John C Weaver, Bellerica, MA (US);
Harold J Liff, Lexington, MA (US);
Thomas C Antognini, Lexington, MA (US);
Assignee:
Eastman Kodak Company, Rochester, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J / ; G05B / ;
U.S. Cl.
CPC ...
364513 ; 356121 ; 382 15 ; 382 14 ; 2502081 ;
Abstract
Method and system for wavefront reconstruction from an image plane intensity distribution profile. An imaging device may be an agent for producing the image plane intensity distribution profile, for example, a point spread function. In one embodiment, the method and system include defining a feature vector from the point spread function, and employing an adaptive computational architecture for associating the feature vector with at least one identifying characteristic of the imaging device, e.g., such as an amount of astigmatism.