The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 12, 1990
Filed:
Jul. 07, 1989
Yoshinari Kozuka, Nagoya, JP;
Yuichi Kakizaki, Nagoya, JP;
Takayuki Sekiya, Kasugai, JP;
Hiroaki Abe, Nagoya, JP;
NGK Insulators, Ltd., , JP;
Abstract
A method and an apparatus for measuring the strength of an AC electric field or an equivalent voltage, or the strength of an AC magnetic field or an equivalent current, based on a light beam which is transmitted through and thus modulated by an optical sensing head due to the Pockel's and Faraday effects, while the sensing head is exposed to the AC electric and magnetic fields. The sensing head includes an optical material which exhibits the Pockel's effect and an optical material which exhibits the Faraday effect, or includes an optical material which exhibits both the Pockel's and Faraday effects. The modulated beam is applied to a light-sensitive element, which produces an electric output signal. A first and a second component of the electric output signal are retrieved by respective detectors. The first component has a same frequency as that of the electric or magnetic field, while said second component has a frequency which is two times that of said electric or magnetic field. The electric field strength or the voltage, and the magnetic field strength or the current are determined by one and the other of the first and second components, respectively.