The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 12, 1990

Filed:

Dec. 08, 1988
Applicant:
Inventors:

Takanobu Fujioka, Chofu, JP;

Takashi Mama, Kawasaka, JP;

Yoshio Kaneko, Tokyo, JP;

Kenichirou Asada, Tokyo, JP;

Assignee:

Ricoh Company, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J / ;
U.S. Cl.
CPC ...
250235 ; 358481 ;
Abstract

A multi-beam detecting apparatus adapted to an optical system in which a recording medium is scanned by a plurality of light beams emitted from respective light sources, includes a photodetector, a light interrupting member, and a control circuit. The photodetector produces detection signals when the corresponding light beams come to a predetermined position. The light interrupting member is interposed between the light sources and the light detecting member, and has transparent portions related to the respective light beams. A controlling circuit controls ON/OFF states of the light source in accordance with the respective detection signals related to the corresponding light beams passing through the respective transparent portions in the light interrupting member.


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