The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 12, 1990

Filed:

May. 20, 1988
Applicant:
Inventor:

Fernand R Loy, Sceaux, FR;

Assignee:

U.S. Philips Corp., New York, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B / ;
U.S. Cl.
CPC ...
350-68 ; 350-67 ;
Abstract

Opto-mechanical analyzer using a single polygon (P) comprising n reflective faces which are arranged parallel to the axis (2) of the cylinder in which the polygon is cut and are determined in such a way that their distribution on the periphery is sinusoidal. The polygon rotates about an axis (1) extending at an angle .theta. to the axis (2) and situated in the plane formed by the axis (2) and the axis (X X') on which the diameter of the cylinder extends. On either side of this diameter the reflective faces have been distributed pairwise parallel. The n faces of the polygon thus have n different inclinations with respect to the axis of rotation and the angular pitch is constant.


Find Patent Forward Citations

Loy, Fernand. (1990). Opto-mechanical analysis system using a single rotating polygon (U.S. Patent No. 4932733). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4932733

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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