The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 12, 1990

Filed:

Sep. 05, 1989
Applicant:
Inventors:

Nam P Suh, Sudbury, MA (US);

Francis A Waldman, Somerville, MA (US);

Richard E von Turkovich, Cambridge, MA (US);

Douglas M Chin, Cambridge, MA (US);

Thomas H Lee, Somerville, MA (US);

Assignee:

Axiomatics Corporation, Cambridge, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
73 73 ; 324664 ; 364556 ; 374115 ;
Abstract

A method of determining the moisture content of a material in which the material is caused to flow continually through a sensor region, the spatially averaged temperature of the material being continually determined independently of the dynamic thermal response of the material. The loss and capacitance of the sensor is also continually determined, the moisture content of the material than being determined in response to the spatially averaged temperature and the loss and capacitance determinations independently of changes in the packing density of the material as it continually flows through the sensor region.


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