The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 05, 1990
Filed:
Jul. 15, 1988
Shinichiro Hayashida, North Kingstown, RI (US);
Hidetoshi Okashiro, Otsu, JP;
Shunichi Yorozu, Otsu, JP;
Toray Industries, Inc., Tokyo, JP;
Abstract
The thickness distribution across a sheet material, formed by biaxially stretching a molten material web delivered from a die, is automatically controlled by a control processing wait. A correspondence relationship between adjustment of adjusting means arranged on the die and the variation of thickness distribution of the sheet material after formation thereof is sequentially estimated using a Kalman filter built into the control processing unit. Responsive to the estimated relationship, the adjusting means are controlled by optimum amounts in order to enable the thickness distribution to approach a target distribution. The accuracy of thickness control of the sheet material can be greatly increased and accurate control can automatically follow any variation in the conditiond of a sheet forming process. The correspondence relationship between the thickness distribution of the sheet material and the adjusting means on the die can be monitored and displayed. Responsive to the displayed relationship, information capable of being fed back to the sheet forming process and effective to render uniform the quality of the sheet material in the width direction can be observed.