The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 05, 1990

Filed:

Oct. 07, 1988
Applicant:
Inventors:

David E Aspnes, Watchung, NJ (US);

Rajaram Bhat, Red Bank, NJ (US);

Etienne G Colas, Asbury Park, NJ (US);

Leigh T Florez, Atlantic Highlands, NJ (US);

James P Harbison, Fair Haven, NJ (US);

Amabrose A Studna, Raritan, NJ (US);

Assignee:

Bell Communications Research, Inc., Livingston, NJ (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
C30B / ; C30B / ; C30B / ; B05C / ;
U.S. Cl.
CPC ...
156601 ; 156610 ; 156613 ; 422108 ; 422245 ; 4272551 ; 118665 ; 118688 ; 118691 ;
Abstract

A method and apparatus for epitaxial growth of precisely one monolayer. The growth is by organometallic chemical vapor deposition in which the substrate is alternately exposed to the anion and cation of a III-V compound. During deposition of the cation, for instance Ga or Al, reflectance difference spectroscopy is performed to obtain the difference of reflected light beams polarized in orthogonal directions. A growth of a monolayer and even of a partial monolayer can be monitored in real time.


Find Patent Forward Citations

Aspnes, David. (1990). Optical control of deposition of crystal monolayers (U.S. Patent No. 4931132). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4931132

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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