The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 29, 1990
Filed:
Aug. 23, 1988
Michael R Monett, Santa Clara, CA (US);
Memory Technology, Boulder, CO (US);
Abstract
A method and apparatus for increasing the throughput of memory disk drive quality control testing. The apparatus consists of a delay line for delaying the input signal from the read circuitry by one period of said input signal. A difference amplifier subtracts the delayed input signal from the undelayed input signal and couples the difference to one input of a comparator. The comparator compares the difference signal to a threshold used to indicate the presence of an 'additional pulse'. This test is performed simultaneously with a 'missing pulse' test. The method involves delaying the input signal by one period and subtracting the delayed signal from the undelayed signal. A comparison of the difference to a predetermined threshold is then performed and where the threshold is exceeded, the corresponding location on the track under test is recorded as a probable defect. This method is performed simultaneously with a conventional method of performing a 'missing pulse' test.