The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 29, 1990

Filed:

Jul. 11, 1988
Applicant:
Inventors:

Andre Delfour, Ramonville, FR;

Francois Falempin, St Michel Sur Orge, FR;

Jacques Isbert, Toulouse, FR;

Claude Sans, Massy, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
356336 ; 364525 ; 250574 ;
Abstract

A granulometry device embodying the invention comprises a measuring probe and a micro-computer. The micro-computer provides digital filtering on a first discrete distribution function that is calculated by statistical inversion from a plurality of radiation measurements supplied by the probe and a theoretical radiation coefficient matrix thereby determining, after an iterative calculation, an optimum relation which should be satisfied by the nodes defining a discrete distribution function so as to offer a maximum correlation with uncertainty measurements. All the discrete distribution functions satisfying this relation are then calculated by statistical inversions. The mirco-computer provides an optimum statistical evaluation of the distribution of particles in a gas or liquid fluid.


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