The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 22, 1990

Filed:

Apr. 27, 1987
Applicant:
Inventors:

Michael S Marzalek, Petaluma, CA (US);

Stephen R Peterson, Santa Rosa, CA (US);

John A Wendler, Urbana, IL (US);

Assignee:

Hewlett-Packard Company, Palo Alto, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
364484 ; 324 / ; 324 / ;
Abstract

Representations of signal edges of a repetitive signal are sampled without triggering, then sorted out based on frequency and sequence and then superimposed along a common time base of one period in order to reconstruct a signal. In a specific embodiment of a method according to the invention, a string of samples of a repetitive, input signal with high frequency components is captured without triggering with relatively low time resolution to determine an approximate waveform from the low resolution samples, then digital signal processing techniques in the form of a fast Fourier transform are applied to a reconstructed time record of the input signal to obtain an accurate frequency for each signal component, and finally the sampled waveform is reconstructed by overlaying sampled components with reference to a common time or phase reference. The FFT is employed to determine the frequency of each signal component very accurately. Further processing, such as bin interpolation based on a window function, may be employed to improve resolution still further.


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