The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 22, 1990
Filed:
Apr. 06, 1987
Alexander J Glass, Ann Arbor, MI (US);
KMS Fusion, Inc., Ann Arbor, MI (US);
Abstract
Method and apparatus for measuring concentration of micrometer- and submicrometer-size particles on a carrier as a function of Mie scattering in the visible spectrum. A collimated beam of white light is directed through a carrier onto the particles, with a portion of the light energy being scattered and a portion transmitted according to Mie scattering theory. Particle size, index of refraction and measurement wavelength are selected such that scattering extinction varies essentially monotonically with the ratio of particle size to illumination wavelength. Particle concentration is indicated as a function of a difference between light scattered at two wavelengths at opposite ends of the visible spectrum.