The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 15, 1990

Filed:

Jun. 09, 1988
Applicant:
Inventors:

Rolf Hedtke, Darmstadt-Eberstadt, DE;

Rolf Loos, Munster, DE;

Roland Mester, Darmstadt, DE;

Jurgen Hansel, Darmstadt, DE;

Assignee:

Robert Bosch GmbH, Stuttgart, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
371 226 ; 371 224 ;
Abstract

Test node equipment is provided between successive component groups operating in cascade and each test node is connected to a data bus system through which test patterns can be provided by a test pattern generator and from which signals can be evaluated by a test pattern analyzer, the test pattern generator and the test pattern analyzer being under control of a test computer. Each test node has a state in which the output of the preceding component group passes through it to the next component group with only a possibility of monitoring possible deficiencies by the test computer and other states in which the cascade operation of component groups can be interrupted at a test node for inserting a test pattern to a following component group or receiving a processed test pattern from a preceding component group. A test node may also contain driver circuits for transfer of rapid data to a memory of the test computer for subsequent processing at a lower speed and may also contain equipment to assist in the use of a so-called signature analysis system.


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