The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 15, 1990
Filed:
May. 13, 1988
Applicant:
Inventors:
Takashi Murahashi, Hachioji, JP;
Hisao Fujita, Hachioji, JP;
Toshihiko Nakazawa, Hachioji, JP;
Toshihiro Takesue, Hachioji, JP;
Toshihiro Motoi, Hachioji, JP;
Assignee:
Konica Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01D / ;
U.S. Cl.
CPC ...
346108 ;
Abstract
A light beam recording system in which the beam is deflected after passage through a focusing element to scan a recording medium. An optical image surface correction system is employed between the deflector and recording medium for correction of the curvature of the field in the main scanning direction. The optical correction system includes an aspherical surface and deviation from a paraxial generating spherical surface to the aspherical surface.