The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 15, 1990
Filed:
Feb. 09, 1989
Harvey D Solomon, Schenectady, NY (US);
William R Catlin, Schenectady, NY (US);
General Electric Company, Schenectady, NY (US);
Abstract
A method is provided for measuring crack growth in a solid comprising a sensor utilizing potential or voltage drop measurements across a preformed and propagating crack. Preferably the sensor is representative of a structural component and is exposed to an aggressive environment like that in which the structural component operates. Measured voltage values are plotted versus a distance at which the voltages are measured by a plurality of pairs of probes, and intercept values are obtained and used in combination with previously measured crack lengths in calculating subsequent crack lengths of a propagating crack.