The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 08, 1990

Filed:

Nov. 05, 1987
Applicant:
Inventors:

P Anthony Crossley, Palo Alto, CA (US);

H Keith Nishihara, Los Altos, CA (US);

Neil D Hunt, Mountain View, CA (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
382 28 ; 356 12 ; 356379 ; 382 42 ;
Abstract

A method for directly measuring the area of a topological surface with an arbitrary boundary shape lying in a fixed elevation different from a fixed surrounding surface elevation relies upon binocular stereo vision. Three stereo correlation measurements are made, one over a window entirely within the surface of interest, a second over a window outside the surface of interest and within the surrounding area, and a third over a window fully containing the surface of interest as well as some of the surrounding area. The correlation measured in the third case is the linear sum of the correlation value over each of the first two cases weighted by the proportion of the window that the two surfaces occupy.


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