The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 08, 1990
Filed:
Feb. 26, 1988
Shigeaki Hirano, Himeji, JP;
Hirotoshi Maekawa, Himeji, JP;
Tsutomu Kubozono, Tokyo, JP;
Minoru Tatemoto, Tokyo, JP;
Mitsubishi Denki Kabushiki Kaisha, Tokyo, JP;
Abstract
A trouble-diagnosable multifunction testing apparatus is disclosed for use with a first half part of a collective connector provided in an automotive vehicle, the first half part of the collective connector including a plurality of signal lines connected respectively to a plurality of electronic control units disposed in the vehicle for transmitting a trouble-diagnosis output signal or various data signals obtained from each of the plurality of electronic control units, and a common switchable signal line connected with each of the plurality of electronic control units for transmitting an electric signal having a first or second logic level, the first half part of the collective connector being connected operatively with both of the signal lines, respectively. When a conventional test unit is connected to the first half connector part, the electronic control units transmit data signals to it at a first rate. When a special high-speed test unit is connected to the fist half connector part, it places a signal on the common switchable signal line which signal causes the electronic control units to transmit data at a rate which is higher than the first rate.