The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 01, 1990
Filed:
Feb. 21, 1989
Applicant:
Inventors:
John D Lane, McLean, VA (US);
Thomas J Scheib, Chesterland, OH (US);
Assignee:
The Babcock & Wilcox Company, New Orleans, LA (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
364157 ;
Abstract
A self-tuning system and method for controlling a process based on a measured variable comprises modular parameter estimators, parameter converters and controllers which are used to control the process and receive input from the process. Self-tuning gain scheduling allows the calculated parameters to be updated by a second variable from the process. Regression analysis is used in conjunction with the conventional gain scheduling to more accurately refine the control action. A limiter is also used in conjunction with the regression analysis to avoid an overly high or low correction signal for the controller.