The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 01, 1990

Filed:

Mar. 02, 1989
Applicant:
Inventor:

Ronald G Arpino, Branford, CT (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N / ;
U.S. Cl.
CPC ...
358106 ; 358 93 ;
Abstract

An inspection system in which the image viewed and the object being inspected lie in a single line of sight of the inspector. In one preferred embodiment, the inspector views a first side of back-to-back mirrors disposed at a 45 degree angle to the line of sight of the inspector. A video camera is disposed to view the reflection of the object from the second side of the mirrors and the image on a CRT is reflected from the first side of the mirrors. Thus, the image seen by the inspector is correctly spacially oriented with respect to the object and the inspector may manually position or re-position the object as easily as if the inspector were directly viewing it. In another preferred embodiment, a flat screen CRT and a miniature video camera are aligned in the direct line of sight from the inspector to the object. Zoom and cross-hair features may be provided in either embodiment.


Find Patent Forward Citations

Arpino, Ronald. (1990). Line-of-sight inspection system (U.S. Patent No. 4922338). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4922338

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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