The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 01, 1990
Filed:
Nov. 30, 1988
Kinya Eguchi, Fujisawa, JP;
Kikue Niitsuma, Yokohama, JP;
Shigeru Wakena, Mobara, JP;
Masayoshi Ezawa, Mobara, JP;
501 Hitachi, Ltd., Chiyoda, JP;
Abstract
An infrared spectrum measuring microscope apparatus which is suitable for accurately identifying the material at a microfine portion. A sample stage is vertically moved and special optical means are provided in the sample stage for enabling high-sensitivity spectral measurement of a microfine portion of samples of various sizes. The infrared microspectometer of the present invention also enables the chemical species of the sample to be identified by the fluorescence spectrum in addition to the information of the infrared spectrum.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile