The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 01, 1990

Filed:

Oct. 11, 1988
Applicant:
Inventors:

Nobufumi Mori, Kanagawa, JP;

Yuichi Hosoi, Kanagawa, JP;

Junji Miyahara, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J / ; H01J / ;
U.S. Cl.
CPC ...
250311 ; 2503272 ; 250397 ;
Abstract

An electron microscope has a two-dimensional sensor located at the image-formation plane. The two-dimensional sensor stores electron beam energy and emits light upon exposure to light or heat. The filament is located at a position displaced from the principal optical axis of the electron beam so that the image of the filament may not be recorded on the two-dimensional sensor. The two-dimensional sensor is, for example, made of stimulable phosphor.


Find Patent Forward Citations

Loading…