The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 01, 1990
Filed:
May. 11, 1989
Richard S Stokes, Orwigsburg, PA (US);
Robert M Muldowney, Stowe, PA (US);
Dana Corporation, Toledo, OH (US);
Abstract
A method for obtaining fatigue life information for an article is disclosed. Initially, an area of interest is determined on the article. A durability schedule is defined for that article as a predetermined number of passes through each of a predetermined number of events, each of the events being defined by the generation of strains in the article having a predetermined range of magnitudes and frequencies. A total effective damage factor caused to the component by one pass through each of the events is next determined, which permits the determination of a total durability factor for all of passes for all of the events defined in the durability schedule. The article is then tested by subjecting it a plurality of passes through all of the events defined in the durability schedule until a termination criteria is reached. Then, a total actual damage factor can be determined based upon the number of tested passes through each of the events defined in the durability schedule. A final durability factor for the article is lastly determined by dividing the total actual damage factor by the total durability factor. A plurality of final durability factors can be used to obtain the desired fatigue life information.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile