The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 24, 1990

Filed:

Jul. 08, 1988
Applicant:
Inventors:

Ying-wei Lin, Penfield, NY (US);

Anthony F Calarco, Fairport, NY (US);

Assignee:

Xerox Corporation, Stamford, CT (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N / ;
U.S. Cl.
CPC ...
358461 ; 358163 ; 35821315 ; 35821316 ; 35821317 ; 35821318 ;
Abstract

Method and apparatus to increase the range of correction of photosite offset and gain response. Each photosite is provided with a correction value for offset and gain response based on measured light intensity value, which is stored in memory. Each photosite correction value is also provided with an attribute value which indicates whether the correction values are to be used as stored, whether a shift of the values is appropriate, in accordance with a stored shift value, or whether the photosite is noncorrectable, and accordingly requires the implementation of a bad pixel routine. Depending on the attribute value, logic is enabled to vary the correction values in accordance with a stored routine for shifting the stored correction value, or implementing a bad pixel routine. If the attribute requires a shifted value, the correction value is shifted a number of places in accordance with a shift stored in the decoder, before it is applied. If the attribute indicates that the photosite response is not correctable, a bad pixel correction routine is enabled, to produce substitute data.


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