The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 24, 1990

Filed:

Dec. 30, 1988
Applicant:
Inventor:

Yuji Itoh, Chigasaki, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
250574 ; 356338 ;
Abstract

A particle measuring device having a light source, scanning means for optically scanning a light from the light source in a direction intersecting the direction of passage of particles to be examined in a portion to be examined through which the particles to be examined pass, means for making the shape of the scanning light applied to the particles to be examined into a shape longer than the length of the particles to be examined in the direction of passage of the particles to be examined, and light receiving means for receiving the light from the portion to be examined.


Find Patent Forward Citations

Itoh, Yuji. (1990). Particle measuring device with elliptically-shaped scanning beam (U.S. Patent No. 4920275). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4920275

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…