The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 24, 1990
Filed:
Apr. 28, 1988
Applicant:
Inventors:
Yasuo Inoue, Hachiouji, JP;
Itaru Endo, Hachiouji, JP;
Assignee:
Olympus Optical Co., Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G12M / ; G02B / ;
U.S. Cl.
CPC ...
4352401 ; 935 53 ; 350507 ; 350524 ;
Abstract
An inverted-design microscope provided with a micromanipulator so as to be movable along the optical axis in interlocking with the movement of the objective lens for focusing pricking in order that the micromanipulator may be operated minutely and simply on an object to be observed without preventing the illuminating system from being attached, detached, replaced or switched. The micromanipulator is so formed as to be able to prick the object along the optical axis of the objective lens in such a manner that the tip part of a stylus of the micromanipulator is always arranged slightly above a focus position of the objective lens.