The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 17, 1990
Filed:
Apr. 06, 1989
Martin A Bender, Seattle, WA (US);
Thomas V Bruhns, Everett, WA (US);
Hewlett-Packard Company, Palo Alto, CA (US);
Abstract
The accuracy of an automated THD measurement performed by an FFT signal analyzer is improved by refining the estimate of the signal's fundamental frequency on which the THD analysis is based. This refinement is accomplished by calculating a parameter that represents the relative accuracy of the estimate and then varying the estimate to maximize the parameter. The result is a process which permits refinement of the fundamental frequency to an almost arbitrary accuracy, resulting in a highly improved measurement of THD.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile