The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 17, 1990
Filed:
Jun. 12, 1989
Haluk Katircioglu, Irvine, CA (US);
John A De Beule, Rancho Santa Margarita, CA (US);
Debaditya Mukherjee, El Toro, CA (US);
Unisys Corporation, Blue Bell, PA (US);
Abstract
A method for internal self-testing is provided for a VLSI chip having gates, logic, registers, memory circuitry, etc. The registers are connected into a shift chain circuit form. A set of control flip-flops operate to convert the registers to multifunction shift registers (MFSR's) which operate as flip-flops during a test cycle and as latches during normal operations. Selected MFSR's function to generate test patterns to the chip circuitry which have output signals to an output MFSR which collects a signature that can be compared to a predetermined signature to determine error-free or error-incurred operation of the VLSI circuitry.