The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 17, 1990
Filed:
Jun. 20, 1988
Johannes G Beha, Wadenswil, CH;
Armin U Blacha, Thalwil, CH;
Rolf Clauberg, Gattikon, CH;
Rolf B Moeller, Munich, DE;
Wolfgang D Pohl, Adliswil, CH;
International Business Machines Corporation, Armonk, NY (US);
Abstract
For observing material structures and/or dynamic processes at surfaces, the known scanning tunneling microscope (STM) is combined with a photoexcitation process leading to photon-assisted tunneling. Thereby, the very fine spatial resolution of the STM is combined with the picosecond or even femtosecond time resolution of laser pulses. The tunnel tip of a scanning tunneling microscope is positioned at tunnel distance with respect to the surface of the sample to be investigated, with an appropriate potential applied across the gap between the tunnel tip and the sample. The tunneling current is gated by means of at least one pulsed laser beam directed at the tuneling region and/or at the tunnel tip.