The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 17, 1990

Filed:

Dec. 02, 1988
Applicant:
Inventors:

Takashi Nishio, Koufu, JP;

Tomoyoshi Ikeya, Yamanashi, JP;

Chiharu Koshio, Yamanashi, JP;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J / ;
U.S. Cl.
CPC ...
356121 ;
Abstract

A light beam spot size measuring device comprises an optical magnifying system. The magnifying system receives an image of the recording light beam spot formed within an optical recording apparatus, and magnifies it. Then the converter receives the magnified image of the beam spot formed on the pickup surface thereof so as to produce an output signal representing the size of the beam spot. An attenuator device attenuates the intensity of the image of the laser beam spot during magnification. The image of the beam spot therefore can be currently measured on the basis of the output signal even with the high intensity of the recording light beam.


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