The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 17, 1990
Filed:
Nov. 28, 1988
Applicant:
Inventors:
Yasuo Kato, Tokyo, JP;
Kiwami Horiguchi, Tokyo, JP;
Ikuo Kitao, Tokyo, JP;
Yoshihiro Takahashi, Tokyo, JP;
Assignee:
Kabushiki Kaisha TOPCON, Tokyo, JP;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B / ; A61B / ;
U.S. Cl.
CPC ...
351211 ; 351237 ;
Abstract
An eye refractive power measuring apparatus is disclosed. It includes a chart projection system for projecting a chart image for test use to a retina of an eye under test by using visible light, a measuring target projection system for projecting a measuring target image to the retina of the eye under test by using invisible light, a display device for displaying the measuring target image as a visible image, a focussing state of the measuring target image being made changeable simultaneous with change of a focussing state of the chart image for test.