The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 10, 1990

Filed:

Feb. 02, 1989
Applicant:
Inventors:

Ying-wei Lin, Penfield, NY (US);

Anthony F Calarco, Fairport, NY (US);

Lisa M Yamonaco, East Rochester, NY (US);

Assignee:

Xerox Corporation, Stamford, CT (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04M / ;
U.S. Cl.
CPC ...
358483 ; 358448 ;
Abstract

A method and apparatus for processing a scan line of image data, wherein image data from portions of the scan line is processed simultaneously along plural channels, each channel processing a portion of the image data, and provided with context information from an adjacent portion of the scan line. Context pixels are added at the trail edge of a first scan line portion, derived from the lead edge of a second scan line portion. In certain image processing requiring preceding and succeeding pixel context information, subsequent to processing, on correctly processing pixels are transferred for subsequent processing, and pixels at the trail edge of a first scan line portion, and the lead edge of a second scan line portion are not transferred, leaving complementary scan line portions.


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