The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 10, 1990

Filed:

Mar. 03, 1989
Applicant:
Inventors:

David L Best, Houston, TX (US);

Brian Clark, Missouri City, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V / ;
U.S. Cl.
CPC ...
324338 ; 175 40 ;
Abstract

A method is proposed for determining the distance from an investigating device to the surface of a medium capable of supporting wave propagation. According to the method, a propagatory wave is generated at a given location along the surface of said medium and spaced laterally therefrom. The propagatory wave is caused to enter the medium and to propagate in the medium. The phase of the propagating signal is detected at a pair of locations respectively spaced longitudinally along the surface of the medium by different distances from the transmitting location. An indication of the lateral spacing between the detecting means and the medium is determined in response to the phase information detected at the pair of locations.


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