The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 10, 1990
Filed:
Apr. 22, 1988
Applicant:
Inventors:
William B Telfair, Newtown, CT (US);
Clifford A Martin, Bridgeport, CT (US);
Paul R Yoder, Wilton, CT (US);
Eugene I Gordon, Pacific Palisades, CA (US);
Assignee:
Tauton Technologies, Inc., Monroe, CT (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J / ;
U.S. Cl.
CPC ...
2504611 ; 250365 ; 250372 ;
Abstract
A beam intensity profilometer produces a fluorescent emission distribution having a spatial distribution linearly proportional to the local intensity of an incident UV beam shined into the profilometer. The spatial distribution of the UV beam is analyzed and displayed as a function of the fluorescent emission.
Telfair, William. (1990). Beam intensity profilometer (U.S. Patent No. 4916319). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4916319
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile