The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 10, 1990
Filed:
May. 12, 1988
Alfred Wouters, San Dimas, CA (US);
Suzan D Weber, Ontario, CA (US);
Michael J Maciocia, Rancho Cucamonga, CA (US);
General Dynamics Corp., Pomona Div., Pomona, CA (US);
Abstract
A miniaturized vacuum generator is powered by pressurized air, such as is commonly available in shop air lines. The generator includes a transducer coupled to the pressurized air line and utilizing the venturi principle to develope a vacuum at a vacuum port to which a vacuum hose may be coupled. This may be used in cleaning circuit boards and small electronic assemblies to pick off bits of solder, filings and other debris and contaiminants which more conventional vacuum cleaners do not effectively remove. The apparatus includes an in-line filter for collecting such debris and contaiminants and preventing them from being blown about by the exhaust. The apparatus may also be used as a pickup device for microchips and other miniature complements on an electronic assembly at a production line. Other uses of the device may be in the jewelry repair field where the debris to be picked up often contains dust and filings of precious metal and, occasionally, lost gemstones. The inline filter admits of ready disassembly for recovery of such materials. The device works without moving parts and is fabricated to a considerable extent from static dissipative materials to prevent the buildup of electrostatic charge which might damage charge-sensitive microchips and other components being handled or worked upon.