The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 03, 1990

Filed:

Jun. 01, 1987
Applicant:
Inventors:

Masami Yamanaka, Miki, JP;

Shinichi Inoue, Kobe, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01G / ; G01G / ;
U.S. Cl.
CPC ...
364567 ; 364557 ; 177 2512 ; 177 2513 ;
Abstract

A force measuring device, such as a weighing device, having device for automatically compensating for temperature-induced zero and span deviations. The device includes force and temperature sensors for producing force and temperature indicative signals, respectively. Device for processing processes these force and temperature signals at various temperatures in no-load and reference-load conditions by regressive analysis in order to obtain and store in memory equations representing the zero and span deviations with temperature. During use of the force measuring device for measurement, the device uses the stored equations to calculate the zero and span deviations from the current temperature to correct the force indicative signal.


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