The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 03, 1990
Filed:
Jan. 29, 1988
Steven E Moran, San Diego, CA (US);
Other;
Abstract
An optically phase-locked electronic speckle pattern interferometer mixes a local oscillator beam with a beam reflected from a target surface to create a speckle pattern at each of two separate image planes. The speckle pattern includes speckles whose intensities vary as a result of time-varying Doppler shifting of the reflected beam by movement or deformation of the target surface. The local oscillator beam is phase-locked to the Doppler signature of a lock-point speckle on one image plane. The phase-locking of the local oscillator beam to Doppler information of interest enables the interferometer to coherently detect speckle in the image plane sharing frequency, amplitude, and phase characteristics with the lock-point speckle, which supports the efficient processing of images obtained from the other image plane. The processing produces a contoured image of the target surface, with demarcation between coherently and non-coherently detected speckle.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile