The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 03, 1990
Filed:
Feb. 14, 1989
Carl H Sondergeld, Broken Arrow, OK (US);
Chandra S Rai, Tulsa, OK (US);
Richard M Alford, Broken Arrow, OK (US);
Amoco Corporation, Chicago, IL (US);
Abstract
A novel method for detecting and measuring elastic anisotropy in a sample of the earth's formations is provided. A dyad of time series signal representative of the sample's response to imparted shear waves is recorded. The dyad of time series signals can then be processed to detect and measure elastic anisotropy in the sample. More particularly, the dyad of time series signals are collected by imparting shear waves having first and second polarizations into the samples with a shear wave transducer and recording the sample's response to each of the imparted shear waves by shear wave transducers having first and second polarizations. In one embodiment of the invention, the dyad of time series signals can be diagonalized to detect and measure elastic anisotropy in the sample. In another embodiment, the dyad of time series signals can be processed for a plurality of rotation angles and the resulting rotated dyad of time series signals can be displayed to detect and measure elastic anisotropy in the sample.