The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 27, 1990

Filed:

Dec. 27, 1988
Applicant:
Inventor:

Larry D Flesner, San Diego, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
250352 ; 378207 ;
Abstract

An apparatus for testing infrared detector response to ionizing radiation within an infrared shielded environment includes a cryostat having an aperture which is positioned adjacent to a scanning electron microscope (SEM). The SEM generates an electron beam which propagates through the aperture and is absorbed by a foil positioned adjacent the detector. The interaction of the electron beam with the foil produces X-rays which irradiate the detector. Instruments electrically coupled to the detector record and display the detector response.


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