The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 20, 1990
Filed:
Sep. 30, 1985
Paul H Eichel, Albuquerque, NM (US);
Other;
Abstract
A method of detecting intensity edge paths in an image produced by a technique which is selected from the group consisting of X-ray, CAT scan, nuclear magnetic resonance, photographic, video recording, and photodetection techniques, includes an initial step of determining the gradient magnitude and direction of the image in an array or lattice of node points using a Gaussian weighted gradient operator. A root node having a high probability of being on an edge path is then selected by selecting a node having a high gradient magnitude. The metric for each adjacent node to the root node is then calculated. The various metrics are stored for each such adjacent node. Using the adjacent node having the highest metric, the metrics for other nodes adjacent thereto are calculated. These steps are repeated and the edge path having the highest metric is thereby determined.