The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 13, 1990
Filed:
Feb. 05, 1988
Takashi Toriu, Kawasaki, JP;
Hiromichi Iwase, Kawasaki, JP;
Fujitsu Limited, Kawasaki, JP;
Abstract
This invention relates to a method and apparatus for extracting contour lines from a pattern obtained in image processing. The disclosed method and apparatus makes it possible to obtain the contour lines in real-time and, moreover, can be easily incorporated into hardware. To achieve these objects, a invention applies the simplified discrimination method for selecting pixels, which form the pattern contour, wherein each pixel is examined within groups of pixel, i.e. X-axis and Y-axis groups. The magnitude of a gray level gradient of each pixel is compared with those of neighboring pixels located in either direction of X-axis group or Y-axis. The pixel which has the maximum magnitude of gray level gradient among those of adjacent pixels is discriminated from each group as contour date. This discrimination method is simple and remarkably improved. When contour lines for two groups are combined, the pattern contours can be easily obtained.