The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 13, 1990
Filed:
Aug. 04, 1987
Gary W Box, Golden Valley, MN (US);
Thomas S Foote-Lennox, Bloomington, MN (US);
Rodney G Herreid, St. Louis Park, MN (US);
James F Hoff, Shoreview, MN (US);
Dennis J Leisz, Minnetonka, MN (US);
John A Perlick, Brooklyn Park, MN (US);
Terry T Steeden, Richfield, MN (US);
John J Turner, New Brighton, MN (US);
Curtis R Alexander, Forest Lake, MN (US);
Wave Technologies, Inc., Plymouth, MN (US);
Abstract
The present invention relates to time measurement apparatus and method for measuring, with picosecond precision, intervals between single edged events, where each measured interval comprises the summation of a rough clock count and fine or calibrated vernier counts of measured fractional clock periods before and after each START and STOP event selected from a calibrated vernier memory. The calibrated vernier memory takes the form of a table of linear voltage versus time developed using pseudo-random generated measurement events of random duration and random separation.