The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 13, 1990
Filed:
Jan. 05, 1989
Leon Kaufman, San Francisco, CA (US);
David M Kramer, San Rafel, CA (US);
Ricardo Guzman, San Francisco, CA (US);
The Regents of the University of California, Berkeley, CA (US);
Abstract
Variable voxel shifts required for shifting a 3D structure into a common oblique or contoured slice volume based on an existing 3D image are achieved by effecting variable f(x,y) phase shifts in corresponding frequency domain data parallel to a selected axis dimension and then reconstructing a new three-dimensional image having the 3D structure all located within a common oblique or otherwise contoured slice volume such that it may viewed in a single planar image display without loss of volume resolution. Equivalent convolution processes withing the spatial domain may also be empolyed. Oblique or curved reconstructions can thus be made using either originally acquired frequency domain data (used to construct the original image) or frequency domain data obtained by inverse Fourier transforming the available spatial domain data of the images themselves.