The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 13, 1990

Filed:

Nov. 10, 1987
Applicant:
Inventors:

Hans-Heinrich Willberg, Altoging/Bad Feilnbach, DE;

Ekkehard Ueberreiter, Raubling, DE;

Franz Schottler, Grosskarolinenfeld, DE;

Assignee:

Multitest, Elektronische Systeme GmbH, Rosenheim-Aisingerwies, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B07C / ;
U.S. Cl.
CPC ...
209573 ; 3241 / ;
Abstract

An apparatus for testing and sorting electronic components (33), in particular IC's, is directly mounted on the mounting (2a, 2b to 10a, 10b), preferably forming part of a manipulator, for a test computer. In order to convey the components (33) between an input magazine (16), a testing head (20) and an output magazine (17) a suction head (20) is provided which is movable on a carriage guide (15) and which may be lowered. The mounting forming part of the manipulator permits the test computer (1) and the whole apparatus arranged on a slope so that the components (33) in the magazine rods (26) of the input magazine (16) and the output magazine (17) slide forwards under gravity.


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