The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 13, 1990
Filed:
Nov. 10, 1988
Applicant:
Inventors:
Donald A Leonard, Cupertino, CA (US);
Harold E Sweeney, Menlo Park, CA (US);
Assignee:
GTE Government Systems Corporation, Stamford, CT (US);
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356352 ; 356236 ;
Abstract
The etendue (throughput or area-solid angle product) of a high resolution interferometer is maintained at a substantially high level by use of a transparent chamber defined by a highly reflective internal surface, the chamber being located at the input to the interferometer. The chamber has an input aperture to admit light into the chamber and an output aperture or exit opening to pass light to the interferometer. By integrating the input light through multiple reflections thereof within the chamber until it exits to the interferometer, the etendue of the latter is substantially enhanced.